Faculty Profiles

Aaron D. Franklin
Associate Professor of Chemistry
Office: 
CIEMAS 3473, Durham, NC 27708
Phone: 
(919) 681-9471

Overview

Education:

Ph.D., Purdue University 2008

B.S.E., Arizona State University 2004

Noyce, Steven G., et al. “Electronic Stability of Carbon Nanotube Transistors Under Long-Term Bias Stress..” Nano Letters, vol. 19, no. 3, Mar. 2019, pp. 1460–66. Epmc, doi:10.1021/acs.nanolett.8b03986. Full Text

Cardenas, J. A., et al. “Impact of Morphology on Printed Contact Performance in Carbon Nanotube Thin-Film Transistors.” Advanced Functional Materials, vol. 29, no. 1, Jan. 2019. Scopus, doi:10.1002/adfm.201805727. Full Text

Lin, Y. C., et al. “Effects of Gate Stack Composition and Thickness in 2-D Negative Capacitance FETs.” Ieee Journal of the Electron Devices Society, vol. 7, Jan. 2019, pp. 645–49. Scopus, doi:10.1109/JEDS.2019.2922441. Full Text

Andrews, J. B., et al. “Fully Printed and Flexible Carbon Nanotube Transistors for Pressure Sensing in Automobile Tires.” Ieee Sensors Journal, vol. 18, no. 19, Oct. 2018, pp. 7875–80. Scopus, doi:10.1109/JSEN.2018.2842139. Full Text

Cheng, Z., et al. “Contacting and Gating 2-D Nanomaterials.” Ieee Transactions on Electron Devices, vol. 65, no. 10, Oct. 2018, pp. 4073–83. Scopus, doi:10.1109/TED.2018.2865642. Full Text

Andrews, Joseph B., et al. “Patterned Liquid Metal Contacts for Printed Carbon Nanotube Transistors..” Acs Nano, vol. 12, no. 6, June 2018, pp. 5482–88. Epmc, doi:10.1021/acsnano.8b00909. Full Text

Najmaei, Sina, et al. “Cross-Plane Carrier Transport in Van der Waals Layered Materials..” Small (Weinheim an Der Bergstrasse, Germany), vol. 14, no. 20, May 2018. Epmc, doi:10.1002/smll.201703808. Full Text

Lin, Y. C., et al. “Realizing ferroelectric Hf0.5Zr0.5O2 with elemental capping layers.” Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, vol. 36, no. 1, Jan. 2018. Scopus, doi:10.1116/1.5002558. Full Text

Franklin, A. D., et al. “75 years of the Device Research Conference - A history worth repeating.” Ieee Journal of the Electron Devices Society, vol. 6, no. 1, Dec. 2017, pp. 116–20. Scopus, doi:10.1109/JEDS.2017.2780778. Full Text

Liu, J., et al. “Additive engineering for high-performance room-temperature-processed perovskite absorbers with micron-size grains and microsecond-range carrier lifetimes.” Energy and Environmental Science, vol. 10, no. 11, Nov. 2017, pp. 2365–71. Scopus, doi:10.1039/c7ee02272g. Full Text

Pages

Franklin, A. D. “Carbon Nanotube Electronics.” Emerging Nanoelectronic Devices, vol. 9781118447741, 2015, pp. 315–35. Scopus, doi:10.1002/9781118958254.ch16. Full Text

Cardenas, J. A., et al. “Exploring silver contact morphologies in printed carbon nanotube thin-film transistors.” Device Research Conference  Conference Digest, Drc, vol. 2018-June, 2018. Scopus, doi:10.1109/DRC.2018.8442217. Full Text

Noyce, S. G., et al. “Bias stress stability of carbon nanotube transistors with implications for sensors.” Device Research Conference  Conference Digest, Drc, vol. 2018-June, 2018. Scopus, doi:10.1109/DRC.2018.8442226. Full Text

Andrews, J. B., et al. “Fully printed and flexible carbon nanotube transistors designed for environmental pressure sensing and aimed at smart tire applications.” Proceedings of Ieee Sensors, vol. 2017-December, 2017, pp. 1–3. Scopus, doi:10.1109/ICSENS.2017.8233875. Full Text

Cheng, Z., et al. “Edge contacts to multilayer MoS2 using in situ Ar ion beam.” Device Research Conference  Conference Digest, Drc, 2017. Scopus, doi:10.1109/DRC.2017.7999454. Full Text

Price, K. M., and A. D. Franklin. “Integration of 3.4 nm HfO2 into the gate stack of MOS2 and WSe2 top-gate field-effect transistors.” Device Research Conference  Conference Digest, Drc, 2017. Scopus, doi:10.1109/DRC.2017.7999405. Full Text

McGuire, F. A., et al. “MoS2 negative capacitance FETs with CMOS-compatible hafnium zirconium oxide.” Device Research Conference  Conference Digest, Drc, 2017. Scopus, doi:10.1109/DRC.2017.7999478. Full Text

Catenacci, M. J., et al. “Fully printed memristors from Cu-SiO2 core-shell nanowire composites.” Device Research Conference  Conference Digest, Drc, 2017. Scopus, doi:10.1109/DRC.2017.7999482. Full Text

Franklin, A. D. “Scaling, stacking, and printing: How 1D and 2D nanomaterials still hold promise for a new era of electronics.” Digest of Technical Papers  Symposium on Vlsi Technology, 2017, pp. T44–45. Scopus, doi:10.23919/VLSIT.2017.7998194. Full Text

Cheng, Z., et al. “Using Ar Ion beam exposure to improve contact resistance in MoS2 FETs.” Device Research Conference  Conference Digest, Drc, vol. 2016-August, 2016. Scopus, doi:10.1109/DRC.2016.7548484. Full Text

Franklin, A. D., and W. Haensch. “Defining and overcoming the contact resistance challenge in scaled carbon nanotube transistors.” Device Research Conference  Conference Digest, Drc, 2014, pp. 191–92. Scopus, doi:10.1109/DRC.2014.6872362. Full Text

Pages